Detailed information on the SmartLab series intelligent X-ray diffractometer:

1、 Instrument Introduction

intelligenceXXRDSmartLabThe series is a high-performance and multifunctional device in today's worldXThe X-ray diffractometer adopts the principles of physicsCBOCross optical system, automatic recognition of all optical components, sample stage, intelligent measurement and analysis softwareSmartLab GuidanceOne instrument can intelligently test ordinary powder samples, liquid samples, nanomaterials, drugs, semiconductors, and thin film samples.

2、 Technical parameters

1、XThe power of the radiation generator is3KWNew type9KWTarget shifting

2The angle measuring instrument is a horizontal angle measuring instrument

3The smallest step of the angle measuring instrument is1/10000Degree, the most high-precision angle measuring instrument (dual optical encoding, direct axis positioning) (Science)

4Angle measuring instrument with programmable variable slit

5Automatically identify all optical components and sample stages (in science)

6、CBOCross optical path, providing focused optical path and high-intensity high-resolution parallel optical path (withMirror）(Science)

7Small angle scattering test component(SAXS / Ultra SAXS)

8Multi purpose thin film testing components

9Micro area testing componentsCBO-FMicro area optical components

10、In-PlaneTest component (unique to science)

11Incident endKa1Optical components

12High speed detectorD/teX-Ultra(Energy resolution)20%Below)

132D surface explorationPILATUS 100K/R(Detector for synchrotron radiation loop, capable of receiving direct radiationXray)

14Intelligent measurement and analysis softwareSmartLab Guidance（）

3、 Main features

intelligenceXXRDSmartLabThe series can be widely applied in various fields of material structure analysis.

The materials that can be analyzed include: metallic materials, inorganic materials, composite materials, organic materials, nanomaterials, and superconducting materials

The material states that can be analyzed include: powder samples, block samples, thin film samples, and micro area micro samples

The main applications are

1. Qualitative and quantitative analysis of phase composition of powder samples

2. Calculate crystallinity and grain size

3. Determine crystal system, grain size, and distortion

4. Rietveldquantitative analysis

5. Thin film sample analysis, including thin film phase, multilayer film thickness, surface roughness, and charge density

6. In-PlaneThe device can simultaneously measure the vertical structure of the sample and the depth structure of the sample

7. Small angle scattering and particle size distribution of nanomaterials

8. Analysis of micro area samples